Applicants are invited to get in touch with the local contact prior to send a proposal in order to verify the feasibility of their experiment.

FEI Titan3 80-300
monochromated and Cs (probe) corrected

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The FEI Titan3 is a 300kV FEG-(S)TEM in which the probe forming lens is aberration corrected to allow sub-angstrom STEM imaging. It is equipped with FEIs ultra-bright XFEG source and Wien-type monochromator that allows narrow energy electron probes for high resolution electron energy loss spectroscopy (EELS) for both chemical and electronic characterisation. The spectrometer is a Gatan Tridiem 865 high resolution imaging filter. This microscope is operable at three energies: 300, 200 and 80 keV and has a Super-TWIN pole-piece allowing specimen tilting up to +/- 80 degrees with dedicated tomography holders. It is equipped with three annular dark-field (ADF) and one BF detector for STEM imaging modes. An EDAX Si(Li) energy dispersive X-ray detector allows for X-ray microanalysis.

FEI Tecnai F20

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This 200 kV analytical FEG (S)TEM is equipped with a high-angle annular dark field detector, X-ray microanalysis facility, Gatan Imaging Filter (GIF), and control software to enable the simultaneous acquisition of a variety of chemically-sensitive signals (X-ray, Z-contrast images and electron energy loss spectra). The microscope has a SuperTwin objective lens with a maximum sample tilt range of ±80° and is ideal for tomographic acquisition.




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The Osiris is an analytical instrument designed for TEM imaging and fast chemical mapping in STEM configuration using EDX and EELS. The microscope can be operated at 80 and 200 kV acceleration voltage. It has an extreme Schottky gun (FEIs 'XFEG' gun), which provides a high current (up to 50nA) into a nanometre-sized probe. Specimens are mounted in side-entry holders with the following capabilities: low-background beryllium double-tilt, standard Be double-tilt, single-tilt (+/-35 degrees), tomography single-tilt (+/-80 degrees), tomography tilt-rotate, tomography on-axis, low temperature (liquid nitrogen) beryllium double-tilt, plus others.

TEM images are recorded with a Gatan UltraScan1000XP (2048 by 2048 pixel) camera with high-speed upgrade. STEM can be performed using FEIs Tecnai Imaging and Analysis (TIA) or Gatan DigiScan II system. Four STEM detectors (HAADF, DF4, DF2 and BF) allow angular integration over a wide range of collection angles and are compatible with the EEL spectrometer. EDX detectors are FEIs Super-X system employing 4 Bruker silicon drift detectors (SDD) for high collection efficiency (>0.9 sr solid angle) and high count rates (>250 kcps). EELS is performed using Gatan's Enfinium ER 977 spectrometer with electrostatic shuttering and fast Voltage Scan Module for Dual EELS (sequential low-loss and high-loss spectrum acquisition) and RangeEELS.

Finally, tomography, through-focal-series and microprobe STEM (STEM-CCD imaging) allows three-dimensional reconstruction, exit-wave reconstruction and strain mapping capability respectively.


 Philips CM300

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This 300 kV analytical FEG TEM is equipped with X-ray microanalysis facility, a Lorentz lens for high-resolution magnetic imaging, and an electrostatic biprism for off-axis electron holography electron holography and Fresnel defocus imaging.




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This 400 kV instrument has an objective lens polepiece designed specifically for optimum high resolution performance. The top entry stage results in excellent sample stability over long periods. Specimen tilt angles of up to ± 25° can be achieved in a polepiece that has a very narrow gap and hence a low spherical aberration coefficient of 0.9 mm.

FEI Helios NanoLab 600 Dual Beam

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A combined Focused Ion Beam (FIB)/ FEG SEM fitted with ancillary equipment for the preparation of TEM membranes and needle samples. The instrument is fitted with a large area OI EDS detector, OI EBSD and FSDs, secondary electron and ion detectors, BSE detectors, STEM 14-segment detector and an Omniprobe in-situ manipulator.

 Photos credits: Dr. Giorgio Divitini