Applicants are invited to get in touch with the local contact prior to send a proposal in order to verify the feasibility of their experiment.

Titan 80-300

Chalmers-Titan

This is a field emission gun instrument with a monochromator for high energy resolution EELS. A high resolution energy filter 866 GIF Tridiem is mounted on the microscope. The condenser lenses have a spherical aberration corrector giving 70 pm resolution in high resolution STEM imaging and allowing high spatial resolution spectroscopy including electron energy loss spectroscopy (EELS) and energy dispersive X-ray (EDX) analysis. The microscope has a bi prism for off-axis electron holography and a Lorentz lens for low magnification holography and magnetic field-free experiments. Tomography can be carried out in both TEM and STEM mode including high angle annular dark-field STEM. Holders for dynamic in-situ STM and AFM experiments and corresponding control unit from Nanofactory Instruments are available.

 
Tecnai G2

Chalmers-Tecnai

This is a 200 kV TEM/STEM with a LaB6 filament and an EDX system. It has a high-angle annular dark-field STEM detector. Tomography can be performed in both TEM and STEM mode. Lower acceleration voltages than 200 kV can also be used. Holders for dynamic in-situ STM and AFM experiments and corresponding control unit from Nanofactory Instruments are available.

 
Philips CM200

This is a 200 kV TEM with a Schottky field emission gun that also can be used at 120 kV. In-situ holders for STM and AFM experiments and corresponding control from Nanofactory Instruments unit are available. The TEM is equipped with an EDX system and a Gatan energy filter.


Extensive equipment for TEM specimen preparation is available. It includes both facilities for conventional specimen preparation (low-speed diamond saws, ultrasonic cutters, ultramicrotomes, sparc cutters, tripods, ion mills (PIPS and Fischione), chemical polishing and electropolishing). There are also two combined focused ion beam and scanning electron microscope FIB-SEM FEI DualBeam systems.

 
 
 
Dual-Beam

Chalmers-Dual-Beam

 FEI DualBeam Versa 3D LoVac and a DualBeam Strata 235. These are two FIB-SEM systems for advanced TEM specimen preparation with field emission guns on the SEM columns and in-situ manipulators.