Applicants are invited to get in touch with the local contact prior to send a proposal in order to verify the feasibility of their experiment.

FEI Titan3 G2 50-300 PICO

Julich titan-pico

The PICO is a unique fourth generation field emission gun transmission electron microscope equipped with a high-brightness electron gun, a monochromator, a probe spherical aberration corrector, a spherical and chromatic achro-aplanat image corrector, a Gatan Quantum ERS post-column spectrometer and a Gatan Ultrascan 4000 CCD camera. The microscope has TEM and STEM resolutions of 50 pm at 300 kV and system energy resolutions (at a spatial resolution of 140 pm) of 100 meV at 80 kV and 40 pA and 130 meV at 300 kV and 45 pA.

Here is a short video showing how the PICO works.

 
FEI Titan G2 60-300 HOLO

2014 Julich titan-holo

This instrument is a dedicated 300 kV electron microscope designed to carry out both off-axis electron holography and in situ experiments. The instrument is equipped with two electron biprisms, a specially designed C-TWIN lens (pole piece gap > 10 mm) and an image spherical aberration corrector, a high brightness electron gun, a Gatan Tridiem 865 ERS spectrometer and a Gatan Ultrascan 1000XP-P CCD camera. The instrument allows for magnetic field visualisation by means of spherical aberration corrected Lorentz microscopy and electron holography at elevated and reduced specimen temperatures. Owing to the large pole piece gap, a variety of in situ experiments using dedicated sample holders can be performed.

 
FEI Titan 80-300 TEM

Julich titan-tem1

The Titan TEM is field emission gun transmission electron microscope equipped with an image spherical aberration corrector. The microscope has an information limit of 80 pm and was one of the first sub-Ångström resolution transmission electron microscopes operating at an acceleration voltage of 300 kV. Digital images are acquired using a Gatan Ultrascan 1000P 2k slow scan CCD camera. A unique feature of this microscope is the installation of ATLAS® software for the measurement of residual lens aberrations.

 
FEI Titan 80-300 STEM 

Julich titan-stem

The Titan STEM is a field emission gun scanning transmission electron microscope equipped with a probe spherical aberration corrector, an electron gun monochromator and a Gatan Tridiem 865 ER post column spectrometer. It has a STEM resolution of 80 pm and an energy resolution of 120 meV at 300 kV and 40 pA.

 

 

 

 

 

 

 

FEI Titan 80-200 ChemiSTEM

Julich titan-holo

The FEI Titan G2 80-200 CREWELEY is a remotely operated field emission gun (scanning) transmission electron microscope equipped with a high-brightness Schottky field emission electron gun, a Cs probe corrector, a Super-X EDX system, an UltraScan 1000XP-P charge coupled digital camera, an on-axis bright-field/dark-field STEM detector as well as a Gatan Enfinium ER (model 977) spectrometer with DUAL EELS option allowing a simultaneous read-out of EDX and EELS signals at a speed of 1000 spectra per second. The Titan G2 80-200 CREWELEY is characterised by a STEM resolution of 80 pm and TEM information limit of 110 pm at 200 kV.