Applicants are invited to get in touch with the local contact prior to send a proposal in order to verify the feasibility of their experiment.

Zeiss SESAM

Zeiss-SESAM 511

The acronym "SESAM" stands for "Sub-eV-Sub-Ångstrom-Microscope". This microscope is dedicated to chemical analysis at both high spatial (< 1 Å) and high energy (< 0.1 eV) resolution. The SESAM is a 200 kV TEM. An electrostatic electron monochromator enables the reduction of the natural energy spread of the source to below 0.1 eV. The specimen can be illuminated either by a parallel electron beam or by a scanned focused beam (STEM mode). For the STEM mode two annular dark-field detectors are installed, before and after the energy filter. Experiments can be performed using single tilt, double tilt, rotation double tilt, double tilt heating (≈1000°C), double tilt cooling (≈-160°C), as well as double tilt tomography, and for needle-shaped specimen 360° tilt tomography holders. Electron energy-loss spectroscopy (EELS) and energy-filtering TEM (EFTEM) can be performed using the in-column energy filter ("MANDOLINE"-type). Images, EELS spectra, and diffraction patterns are recorded by a 2k x 2k CCD camera, imaging plates, or photographic film. In addition to EELS spectroscopy, energy-dispersive X-ray spectroscopy (EDXS) can be used for chemical analysis.

 
JEOL ARM 1250

HRTEM-Jeol-ARM-1250 511px

The JEOL ARM1250 (short ARM) is a high-voltage microscope operating at electron kinetic energies of up to 1250 kV. It was installed in 1993 and has operated continuously since then. The ARM is equipped with a LaB6 electron emitter giving high intensity of the electron beam. The side-entry goniometer allows for in situ experiments at a spatial resolution of 120 pm. The existing specimen stages make experiments possible in the temperature range between -163 °C and 950 °C. Due to the large pole-piece gap, tilt angles of up to ±45° are possible. Images can be recorded either on CCD, film plates, or imaging plates. For chemical analysis the ARM is equipped with a Gatan imaging filter. The energy resolution in electron energy-loss spectra is about 1.2 eV. For dynamic observations, a BetaCam video system is installed. Specimen drift can be compensated by a drift-correction system.

 
Cs-probe-corrected JEOL ARM200F

MPG - Cs-STEM-full

This is a STEM of the latest generation operating at voltages of 30 kV, 60 kV, 80 kV and 200 kV. It is equipped with a cold field-emission gun, a Gatan GIF Quantum ERS energy filter with DualEELS and FastEELS options, a Centurio EDX system with a large-angle SDD X-ray detector, with Gatan UltraScan 1000XP and Gatan Orius SC200D CCD cameras as well as with HAADF, ABF, BF detectors and will have high energy resolution at high spatial resolution. In STEM mode at 200 kV, the ARM200F allows imaging at a spatial resolution of 61 pm which reduces to a spatial resolution of 136 pm at 30 kV. Special sample holders for in-situ heating and cooling as well as double tilt tomography, and for needle-shaped specimen 360° tilt tomography are available.

 
Cs-image-corrected JEOL ARM200F

MPG - Cs-TEM-full

This is a TEM of the latest generation operating at voltages of 30 kV, 60 kV, 80 kV and 200 kV. It is equipped with a cold field-emission gun, a Gatan GIF Quantum ER energy filter with DualEELS, a QUANTAX 200-STEM EDX system with a large-angle SDD X-ray detector, with Gatan UltraScan 1000XP and Gatan Orius SC200D CCD cameras as well as with HAADF, ABF, BF detectors and will have high energy resolution at high spatial resolution. In HRTEM mode at 200 kV, the ARM200F has an information limit of 71 pm which reduces to a value of 134 pm at 30 kV. Special sample holders for in-situ heating and cooling as well as double tilt tomography, and for needle-shaped specimen 360° tilt tomography are available.